Internal photoemission spectroscopy : Valey V. Afanas'ev fundamentals and recent advances /
Material type:
- 9780080999296
- 543.6 AFA-V
Item type | Current library | Collection | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|---|
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BITS Pilani Hyderabad | 540 | General Stack (For lending) | 543.6 AFA-V (Browse shelf(Opens below)) | Available | 30033 |
Total holds: 0
1. Introduction 2. Internal versus External Photoemission 3. Photoemission into Insulators: Physical Model 4. Internal Photoemission Spectroscopy Methods 5. Injection and monitoring of charge trapping phenomena 6. Analysis of charge trapping kinetics and transport-related effects 7. Silicon-Insulator Interface Barriers 8. Interface Barriers of Wide-Gap and High-Mobility Semiconductors 9. Electron Energy Barriers Between Conducting and Insulating Materials 10. Conclusions
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