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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Bushnell, Michael L.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell and Vishwani D. Agrawal - Boston Kluwer Academic 2000 - 690 p.

ISBN: 9780792379911

Subjects--Topical Terms:
Semiconductor storage devices --Testingﾠ
Mixed signal circuits --Testingﾠ
Digital integrated circuits --Testingﾠ
Integrated circuits --Very large scale integration --Testingﾠ

Dewey Class. No.: 621.395 BUS-M

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