VLSI test principles and architectures : design for testability
Wang, Laung-Terng.
VLSI test principles and architectures : design for testability ed. by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen - Amsterdam Elsevier Morgan Kaufmann Publishers 2006 - 777 p.
The Morgan Kaufmann series in systems on silicon
9780123705976
Integrated circuits --Very large scale integration --Design.
Integrated circuits --Very large scale integration --Testing. οΎ
621.395 WAN-L
VLSI test principles and architectures : design for testability ed. by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen - Amsterdam Elsevier Morgan Kaufmann Publishers 2006 - 777 p.
The Morgan Kaufmann series in systems on silicon
9780123705976
Integrated circuits --Very large scale integration --Design.
Integrated circuits --Very large scale integration --Testing. οΎ
621.395 WAN-L