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Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Jacopo Franco ; Ben Kaczer Guido Groeseneken

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications - Netherlands Springer 2014

ISBN: 9789400776630

Subjects--Topical Terms:
Physics: Semiconductors: Circuits and Systems: Optical and Electronic Materials: Electronic Circuits and Devices

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