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Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer and Arthur D. Friedman
Material type:
TextLanguage: ENG Publication details: New York John Wiley 1990Description: 652 pISBN: - 9780780310629
- 621.3815 ABR-M
| Item type | Current library | Collection | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
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Course Reference Books
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BITS Pilani Hyderabad | 621 | Text & Reference Section (Student cannot borrow these books) | 621.3815 ABR-M (Browse shelf(Opens below)) | Available | 7554 | |||
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Course Reference Books
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BITS Pilani Hyderabad | 621 | Text & Reference Section (Student cannot borrow these books) | 621.3815 ABR-M (Browse shelf(Opens below)) | Available | 7555 | |||
|
Course Reference Books
|
BITS Pilani Hyderabad | 621 | Text & Reference Section (Student cannot borrow these books) | 621.3815 ABR-M (Browse shelf(Opens below)) | Available | 7556 |
Total holds: 0
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| 621.3813 POZ-D Microwave engineering / | 621.3815 ABR-M Digital systems testing and testable design / | 621.3815 ABR-M Digital systems testing and testable design / | 621.3815 ABR-M Digital systems testing and testable design / | 621.3815 BAK-R CMOS : mixed signal circuit design / | 621.3815 BAK-R CMOS : mixed signal circuit design / | 621.3815 FRA-S Design with operational amplifiers and analog integrated circuits / |
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