TY  - BOOK
AU  - Bushnell, Michael L.
AU  - Agrawal, Vishwani D., jt. auth
TI  - Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
SN  - 9780792379911
U1  - 621.395 BUS-M 
PY  - 2000///
CY  - Boston
PB  - Kluwer Academic
KW  - Semiconductor storage devices --Testingﾠ
KW  - Mixed signal circuits --Testingﾠ
KW  - Digital integrated circuits --Testingﾠ
KW  - Integrated circuits --Very large scale integration --Testingﾠ
ER  -