Erni, Rolf, <br/><br/>
Aberration-corrected imaging in transmission electron microscopy :  an introduction / 
Rolf Erni, Swiss Federal Laboratories for Materials Science and Technology (Empa), Switzerland. 
 - 2nd edition. 
 - London  Imperial College Press  2015 
 - xviii, 413 pages :  illustrations ;  24 cm 
<br/><br/>Includes bibliographical references and index. 
<br/><br/>High-resolution transmission electron microscopy -- Scanning transmission electron microscopy -- Limits of conventional atomic-resolution electron microscopy -- Basic principles of electron optics -- Gaussian dioptrics -- Aberrations -- Aberration correctors -- Aberration-corrected imaging. 
<br/><br/><label>ISBN: </label>9781783265282 (hardcover : alk. paper) 
<br/><br/><label>LCCN: </label>2014050221 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Transmission electron microscopy.<br/>Aberration.
<br/><br/><label>LC Class. No.: </label>QH212.T7  / E76 2015 
<br/><br/><label>Dewey Class. No.: </label>570.2825 ERN-R