Afanas'ev, Valery V. <br/><br/>
Internal photoemission spectroscopy :  fundamentals and recent advances / 
Valey V. Afanas'ev 
 - 2nd ed., 
 - London  Elsevier Ltd.,  2014 
 - 385 p. 
<br/><br/> 	1. Introduction 2. Internal versus External Photoemission 3. Photoemission into Insulators: Physical Model 4. Internal Photoemission Spectroscopy Methods 5. Injection and monitoring of charge trapping phenomena 6. Analysis of charge trapping kinetics and transport-related effects 7. Silicon-Insulator Interface Barriers 8. Interface Barriers of Wide-Gap and High-Mobility Semiconductors 9. Electron Energy Barriers Between Conducting and Insulating Materials 10. Conclusions 
<br/><br/><label>ISBN: </label>9780080999296 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Photoelectron spectroscopy<br/>Photoemission<br/>Semiconductors--Junctions
<br/><br/><label>Dewey Class. No.: </label>543.6 AFA-V