TY  - BOOK
AU  - Afanas'ev, Valery V.
TI  - Internal photoemission spectroscopy: fundamentals and recent advances 
SN  - 9780080999296
U1  - 543.6 AFA-V 
PY  - 2014///
CY  - London
PB  - Elsevier Ltd.
KW  - Photoelectron spectroscopy
KW  - Photoemission
KW  - Semiconductors--Junctions
N1  - 	1. Introduction 2. Internal versus External Photoemission 3. Photoemission into Insulators: Physical Model 4. Internal Photoemission Spectroscopy Methods 5. Injection and monitoring of charge trapping phenomena 6. Analysis of charge trapping kinetics and transport-related effects 7. Silicon-Insulator Interface Barriers 8. Interface Barriers of Wide-Gap and High-Mobility Semiconductors 9. Electron Energy Barriers Between Conducting and Insulating Materials 10. Conclusions
ER  -