Abramovici, Miron. <br/><br/>
Digital systems testing and testable design / 
Miron Abramovici, Melvin A. Breuer and Arthur D. Friedman 
 - New York  John Wiley  1990 
 - 652 p. 
<br/><br/><label>ISBN: </label>9780780310629 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits --Design and constructionﾠ<br/>Digital integrated circuits --Testingﾠ
<br/><br/><label>Dewey Class. No.: </label>621.3815 ABR-M