Wang, Laung-Terng. <br/><br/>
VLSI test principles and architectures : design for testability 
ed. by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen 
 - Amsterdam  Elsevier Morgan Kaufmann Publishers  2006 
 - 777 p. 
<br/><br/> The Morgan Kaufmann series in systems on silicon 
<br/><br/><label>ISBN: </label>9780123705976 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits --Very large scale integration --Design.<br/>Integrated circuits --Very large scale integration --Testing. ﾠ
<br/><br/><label>Dewey Class. No.: </label>621.395 WAN-L