TY  - BOOK
AU  - Xiao Liu ; Qiang Xu
TI  - Trace-Based Post-Silicon Validation for VLSI Circuits
SN  - 9783319005331
PY  - 2014///
CY  - Berlin Heidelberg
PB  - Springer
KW  - Engineering: Circuits and Systems: Processor Architectures: Semiconductors
UR  - http://doi.org/10.1007/978-3-319-00533-1
ER  -