Jacopo Franco ; Ben Kaczer Guido Groeseneken <br/><br/>
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications 

 - Netherlands  Springer  2014 
<br/><br/><label>ISBN: </label>9789400776630 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Physics: Semiconductors: Circuits and Systems: Optical and Electronic Materials: Electronic Circuits and Devices