TY  - BOOK
AU  - Jacopo Franco ; Ben Kaczer Guido Groeseneken
TI  - Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
SN  - 9789400776630
PY  - 2014///
CY  - Netherlands
PB  - Springer
KW  - Physics: Semiconductors: Circuits and Systems: Optical and Electronic Materials: Electronic Circuits and Devices
UR  - http://doi.org/10.1007/978-94-007-7663-0
ER  -