Russell, Evan <br/><br/>
Data-driven methods for faulty detection and diagnosis in chemical processes / 
Evan Russell, Leo H. Chiang and Richard D. Braatz 
 - Houston  Springer  2000 
 - 192 p. 
<br/><br/><label>ISBN: </label>9781447111337 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Chemical process control
<br/><br/><label>Dewey Class. No.: </label>660.2815 RUS-E