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Confocal raman microscopy edited by Jan Toporski, Thomas Dieing and Olaf Hollricher

By:

Toporski, Jan

Contributor(s):

Material type: Text

TextSeries: Surface sciences ; Vol. 66Publication details: India Springer Publishers 2018Description: 595 pISBN:

9783319753782

Subject(s):

DDC classification:

621.36 TOP-J

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Collection	Shelving location	Call number	Status	Date due	Barcode	Item holds
Books	BITS Pilani Hyderabad	621	General Stack (For lending)	621.36 TOP-J (Browse shelf(Opens below))	Available		41368

Total holds: 0

This second edition provides a cutting-edge overview of physical, technical and scientific aspects related to the widely used analytical method of confocal Raman microscopy. The book includes expanded background information and adds insights into how confocal Raman microscopy, especially 3D Raman imaging, can be integrated with other methods to produce a variety of correlative microscopy combinations. The benefits are then demonstrated and supported by numerous examples from the fields of materials science, 2D materials, the life sciences, pharmaceutical research and development, as well as the geosciences.

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