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	1.	4D electron microscopy : imaging in space and time / Ahmed H. Zewail and John M. Thomas by Zewail, Ahmed H Thomas, John M., jt. auth Material type: Text; Format: print ; Literary form: Not fiction Language: ENG Publication details: London Imperial College Press 2010 Availability: Items available for loan: BITS Pilani Hyderabad (1)Location, call number: General Stack (For lending) 570.2825 ZEW-A. Add to cart (remove)
	2.	Scanning electron microscopy and x-ray microanalysis / Grahame Lawes and ed. Arthur M. James by Lawes, Grahame James, Arthur M., jt. auth Material type: Text; Format: print ; Literary form: Not fiction Language: ENG Publication details: India Wiley 1987 Availability: Items available for loan: BITS Pilani Hyderabad (1)Location, call number: General Reference Section (Only for Reference) 543.0812 LAW-G. Add to cart (remove)
	3.	Electron microscopy / Uday Veer Singh by Singh, Uday Veer Material type: Text; Format: print ; Literary form: Not fiction Language: ENG Publication details: India Random Publications 2014 Availability: Items available for loan: BITS Pilani Hyderabad (1)Location, call number: General Stack (For lending) 578.45 SIN-U. Add to cart (remove)
	4.	Aberration-corrected imaging in transmission electron microscopy : an introduction / Rolf Erni, Swiss Federal Laboratories for Materials Science and Technology (Empa), Switzerland. by Erni, Rolf Edition: 2nd edition. Material type: Text; Format: print ; Literary form: Not fiction Publication details: London Imperial College Press 2015 Availability: Items available for loan: BITS Pilani Hyderabad (1)Location, call number: General Stack (For lending) 570.2825 ERN-R. Add to cart (remove)
	5.	Scanning electron microscopy for the life sciences / Heide Schatten by Schatten, Heide Material type: Text; Literary form: Not fiction Publication details: New York Cambridge University Press 2013 Availability: Items available for loan: BITS Pilani Hyderabad (1)Location, call number: General Stack (For lending) 570.2825 SCH-H. Add to cart (remove)
	6.	Electron crystallography : electron microscopy and electron diffraction / Xiaodong Zou, Sven Hovmoller and Peter Oleynikov. by Zou, Xiaodong Hovmöller, Sven Oleynikov, Peter Series: ICUr Texts on Crystallography - 16 Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York Oxford University Press 2011 Availability: Items available for loan: BITS Pilani Hyderabad (1)Location, call number: General Stack (For lending) 548.83 ZOU-X. Add to cart (remove)
	7.	Scanning electron microscopy and x-ray microanalysis / Joseph I Goldstein...[et.al.,] by Goldstein, Joeshp Newbury, Dale E Michael, Joseph R Ritchie, Nicholas W.M Scott, John Henry. J Joy, David C Edition: 4th ed., Material type: Text; Literary form: Not fiction Publication details: India Springer Publiciations 2018 Availability: Items available for loan: BITS Pilani Hyderabad (1)Location, call number: General Stack (For lending) 502.825 GOL-J. Add to cart (remove)
	8.	Electronic failure analysis handbooktechniques and applications for electronic and electrical packages, components, and assemblies by Perry L. Martin. Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: New York, N.Y. McGraw-Hill Education, 2000 Online resources: Click here to access online Availability: Items available for loan: BITS Pilani Hyderabad (1). Add to cart (remove)

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