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1.
Trace-Based Post-Silicon Validation for VLSI Circuits by
Material type: Text Text; Format: print
Language: English
Publication details: Berlin Heidelberg Springer 2014
Online resources:
Availability: Items available for loan: BITS Pilani Hyderabad (1).

2.
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs by
Material type: Text Text; Format: print
Language: English
Publication details: Berlin Heidelberg Springer 2014
Online resources:
Availability: Items available for loan: BITS Pilani Hyderabad (1).

3.
Exploring Memory Hierarchy Design with Emerging Memory Technologies by
Material type: Text Text; Format: print
Language: English
Publication details: Berlin Heidelberg Springer 2014
Online resources:
Availability: Items available for loan: BITS Pilani Hyderabad (1).

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An institution deemed to be a University Estd. Vide Sec.3 of the UGC
Act,1956 under notification # F.12-23/63.U-2 of Jun 18,1964

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