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1.
VLSI test principles and architectures : design for testability ed. by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen by
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: ENG
Publication details: Amsterdam Elsevier Morgan Kaufmann Publishers 2006
Availability: Items available for loan: BITS Pilani Hyderabad (2)Location, call number: General Stack (For lending) 621.395 WAN-L, ...

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2.
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell and Vishwani D. Agrawal by
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: ENG
Publication details: Boston Kluwer Academic 2000
Availability: Items available for loan: BITS Pilani Hyderabad (3)Location, call number: Text & Reference Section (Student cannot borrow these books) 621.395 BUS-M, ... Not available: BITS Pilani Hyderabad: Checked out (1).

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An institution deemed to be a University Estd. Vide Sec.3 of the UGC
Act,1956 under notification # F.12-23/63.U-2 of Jun 18,1964
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