| 000 | 01363cam a2200289 i 4500 | ||
|---|---|---|---|
| 001 | 18476762 | ||
| 005 | 20151105165111.0 | ||
| 008 | 150202s2015 enka b 001 0 eng c | ||
| 010 | _a 2014050221 | ||
| 020 | _a9781783265282 (hardcover : alk. paper) | ||
| 040 |
_aOU/DLC _beng _cOU _erda _dDLC |
||
| 042 | _apcc | ||
| 050 | 0 | 0 |
_aQH212.T7 _bE76 2015 |
| 082 | 0 | 0 |
_a570.2825 ERN-R _223 |
| 100 | 1 | _aErni, Rolf, | |
| 245 | 1 | 0 |
_aAberration-corrected imaging in transmission electron microscopy : _ban introduction / _cRolf Erni, Swiss Federal Laboratories for Materials Science and Technology (Empa), Switzerland. |
| 250 | _a2nd edition. | ||
| 260 |
_aLondon _bImperial College Press _c2015 |
||
| 300 |
_axviii, 413 pages : _billustrations ; _c24 cm |
||
| 365 |
_aUSD _b98.00. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 505 | 0 | _aHigh-resolution transmission electron microscopy -- Scanning transmission electron microscopy -- Limits of conventional atomic-resolution electron microscopy -- Basic principles of electron optics -- Gaussian dioptrics -- Aberrations -- Aberration correctors -- Aberration-corrected imaging. | |
| 650 | 0 | _aTransmission electron microscopy. | |
| 650 | 0 | _aAberration. | |
| 906 |
_a7 _bcbc _corignew _d1 _eecip _f20 _gy-gencatlg |
||
| 955 |
_aOU _axn12 2015-06-19 1 copy rec'd., to CIP ver. _arl00 2015-06-24 to SMA |
||
| 999 |
_c22130 _d22130 |
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