| 000 | 00850pam a2200265a 44500 | ||
|---|---|---|---|
| 999 |
_c3486 _d3486 |
||
| 008 | 150502b2010 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780070140004 | ||
| 040 |
_cBITS Pilani Hyderabad _aBITS Pilani Hyderabad |
||
| 041 | _aENG | ||
| 082 | _a530.8 BEW-A | ||
| 100 | _a Bewoor, Anand K | ||
| 245 |
_aMetrology and measurement / _cAnand K Bewoor and Vinay A Kulkarni |
||
| 260 |
_aIndia _bTata McGraw Hill _c2010 |
||
| 300 | _a557 p. | ||
| 650 | _aﾠ | ||
| 650 | _aStatistisches Modell --Datenanalyse --Metrologieﾠ | ||
| 650 | _aDatenanalyse --Metrologie --Statistisches Modellﾠ | ||
| 650 | _aMetrologie --Datenanalyse --Statistisches Modellﾠ | ||
| 650 | _aMetrologyﾠ | ||
| 650 | _aMeasurementﾠ | ||
| 700 | _aKulkarni, Vinay A., jt auth. | ||
| 907 | _a530.8 BEW-A | ||
| 908 | _aKulkarni, Vinay A., jt auth. | ||
| 942 | _2ddc | ||