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VLSI test principles and architectures : design for testability ed. by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Material type:
TextLanguage: ENG Publication details: Amsterdam Elsevier Morgan Kaufmann Publishers 2006Description: 777 pISBN: - 9780123705976
- 621.395 WAN-L
| Item type | Current library | Collection | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|
Books
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BITS Pilani Hyderabad | 621 | General Stack (For lending) | 621.395 WAN-L (Browse shelf(Opens below)) | Available | 15014 | |||
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Books
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BITS Pilani Hyderabad | 621 | General Stack (For lending) | 621.395 WAN-L (Browse shelf(Opens below)) | Available | 9488 |
Total holds: 0
The Morgan Kaufmann series in systems on silicon
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