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Aberration-corrected imaging in transmission electron microscopy :

Erni, Rolf,

Aberration-corrected imaging in transmission electron microscopy : an introduction / Rolf Erni, Swiss Federal Laboratories for Materials Science and Technology (Empa), Switzerland. - 2nd edition. - London Imperial College Press 2015 - xviii, 413 pages : illustrations ; 24 cm

Includes bibliographical references and index.

High-resolution transmission electron microscopy -- Scanning transmission electron microscopy -- Limits of conventional atomic-resolution electron microscopy -- Basic principles of electron optics -- Gaussian dioptrics -- Aberrations -- Aberration correctors -- Aberration-corrected imaging.

ISBN: 9781783265282 (hardcover : alk. paper)

LCCN: 2014050221

Subjects--Topical Terms:
Transmission electron microscopy.
Aberration.

LC Class. No.: QH212.T7 / E76 2015

Dewey Class. No.: 570.2825 ERN-R

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