Aberration-corrected imaging in transmission electron microscopy : (Record no. 22130)

MARC details
000 -LEADER
fixed length control field 01363cam a2200289 i 4500
001 - CONTROL NUMBER
control field 18476762
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20151105165111.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 150202s2015 enka b 001 0 eng c
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
LC control number 2014050221
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781783265282 (hardcover : alk. paper)
040 ## - CATALOGING SOURCE
Original cataloging agency OU/DLC
Language of cataloging eng
Transcribing agency OU
Description conventions rda
Modifying agency DLC
042 ## - AUTHENTICATION CODE
Authentication code pcc
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QH212.T7
Item number E76 2015
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 570.2825 ERN-R
Edition number 23
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Erni, Rolf,
245 10 - TITLE STATEMENT
Title Aberration-corrected imaging in transmission electron microscopy :
Remainder of title an introduction /
Statement of responsibility, etc. Rolf Erni, Swiss Federal Laboratories for Materials Science and Technology (Empa), Switzerland.
250 ## - EDITION STATEMENT
Edition statement 2nd edition.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. London
Name of publisher, distributor, etc. Imperial College Press
Date of publication, distribution, etc. 2015
300 ## - PHYSICAL DESCRIPTION
Extent xviii, 413 pages :
Other physical details illustrations ;
Dimensions 24 cm
365 ## - TRADE PRICE
Price type code USD
Price amount 98.00.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references and index.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note High-resolution transmission electron microscopy -- Scanning transmission electron microscopy -- Limits of conventional atomic-resolution electron microscopy -- Basic principles of electron optics -- Gaussian dioptrics -- Aberrations -- Aberration correctors -- Aberration-corrected imaging.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Transmission electron microscopy.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Aberration.
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN)
a 7
b cbc
c orignew
d 1
e ecip
f 20
g y-gencatlg
955 ## - COPY-LEVEL INFORMATION (RLIN)
Classification number, CCAL (RLIN) OU
-- xn12 2015-06-19 1 copy rec'd., to CIP ver.
-- rl00 2015-06-24 to SMA
952 ## - LOCATION AND ITEM INFORMATION (KOHA)
Withdrawn status
Holdings
Lost status Source of classification or shelving scheme Damaged status Not for loan Collection code Home library Current library Shelving location Date acquired Cost, normal purchase price Total Checkouts Full call number Barcode Date last seen Date last checked out Price effective from Koha item type
  Dewey Decimal Classification     570 BITS Pilani Hyderabad BITS Pilani Hyderabad General Stack (For lending) 05/11/2015 98.00 2 570.2825 ERN-R 27372 13/07/2024 09/05/2018 05/11/2015 Books
An institution deemed to be a University Estd. Vide Sec.3 of the UGC
Act,1956 under notification # F.12-23/63.U-2 of Jun 18,1964

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