Aberration-corrected imaging in transmission electron microscopy : (Record no. 22130)
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000 -LEADER | |
---|---|
fixed length control field | 01363cam a2200289 i 4500 |
001 - CONTROL NUMBER | |
control field | 18476762 |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20151105165111.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 150202s2015 enka b 001 0 eng c |
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER | |
LC control number | 2014050221 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9781783265282 (hardcover : alk. paper) |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | OU/DLC |
Language of cataloging | eng |
Transcribing agency | OU |
Description conventions | rda |
Modifying agency | DLC |
042 ## - AUTHENTICATION CODE | |
Authentication code | pcc |
050 00 - LIBRARY OF CONGRESS CALL NUMBER | |
Classification number | QH212.T7 |
Item number | E76 2015 |
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 570.2825 ERN-R |
Edition number | 23 |
100 1# - MAIN ENTRY--PERSONAL NAME | |
Personal name | Erni, Rolf, |
245 10 - TITLE STATEMENT | |
Title | Aberration-corrected imaging in transmission electron microscopy : |
Remainder of title | an introduction / |
Statement of responsibility, etc. | Rolf Erni, Swiss Federal Laboratories for Materials Science and Technology (Empa), Switzerland. |
250 ## - EDITION STATEMENT | |
Edition statement | 2nd edition. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Place of publication, distribution, etc. | London |
Name of publisher, distributor, etc. | Imperial College Press |
Date of publication, distribution, etc. | 2015 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | xviii, 413 pages : |
Other physical details | illustrations ; |
Dimensions | 24 cm |
365 ## - TRADE PRICE | |
Price type code | USD |
Price amount | 98.00. |
504 ## - BIBLIOGRAPHY, ETC. NOTE | |
Bibliography, etc | Includes bibliographical references and index. |
505 0# - FORMATTED CONTENTS NOTE | |
Formatted contents note | High-resolution transmission electron microscopy -- Scanning transmission electron microscopy -- Limits of conventional atomic-resolution electron microscopy -- Basic principles of electron optics -- Gaussian dioptrics -- Aberrations -- Aberration correctors -- Aberration-corrected imaging. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Transmission electron microscopy. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Aberration. |
906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) | |
a | 7 |
b | cbc |
c | orignew |
d | 1 |
e | ecip |
f | 20 |
g | y-gencatlg |
955 ## - COPY-LEVEL INFORMATION (RLIN) | |
Classification number, CCAL (RLIN) | OU |
-- | xn12 2015-06-19 1 copy rec'd., to CIP ver. |
-- | rl00 2015-06-24 to SMA |
952 ## - LOCATION AND ITEM INFORMATION (KOHA) | |
Withdrawn status |
Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Collection code | Home library | Current library | Shelving location | Date acquired | Cost, normal purchase price | Total Checkouts | Full call number | Barcode | Date last seen | Date last checked out | Price effective from | Koha item type |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Dewey Decimal Classification | 570 | BITS Pilani Hyderabad | BITS Pilani Hyderabad | General Stack (For lending) | 05/11/2015 | 98.00 | 2 | 570.2825 ERN-R | 27372 | 13/07/2024 | 09/05/2018 | 05/11/2015 | Books |