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Reliability of RoHS-Compliant 2D and 3D IC interconnects

Reliability of RoHS-Compliant 2D and 3D IC interconnects by John H. Lau. - New York, N.Y. McGraw-Hill Education, 2011

ISBN: 9780071753791

Subjects--Topical Terms:
Interconnects (Integrated circuit technology) Green technology

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