Image from Amazon.com
VLSI test principles and architectures : design for testability ed. by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Material type:
TextLanguage: ENG Publication details: Amsterdam Elsevier Morgan Kaufmann Publishers 2006Description: 777 pISBN: - 9780123705976
- 621.395 WAN-L
| Item type | Current library | Collection | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|
Books
|
BITS Pilani Hyderabad | 621 | General Stack (For lending) | 621.395 WAN-L (Browse shelf(Opens below)) | Available | 15014 | |||
|
Books
|
BITS Pilani Hyderabad | 621 | General Stack (For lending) | 621.395 WAN-L (Browse shelf(Opens below)) | Available | 9488 |
Total holds: 0
Browsing BITS Pilani Hyderabad shelves, Shelving location: General Stack (For lending), Collection: 621 Close shelf browser (Hides shelf browser)
|
|
|
|
|
|
|
||
| 621.395 WAK-J Digital design : principles and practices / | 621.395 WAK-J Digital design : principles and practices / | 621.395 WAN-L VLSI test principles and architectures : design for testability | 621.395 WAN-L VLSI test principles and architectures : design for testability | 621.395 WAN-Z VLSI / | 621.395 WOL-W Modern VLSI design : IP-based design / | 621.395 WOL-W Modern VLSI design : IP-based design / |
The Morgan Kaufmann series in systems on silicon
There are no comments on this title.
Log in to your account to post a comment.