Aberration-corrected imaging in transmission electron microscopy : an introduction / Rolf Erni, Swiss Federal Laboratories for Materials Science and Technology (Empa), Switzerland.
Material type:
TextPublication details: London Imperial College Press 2015Edition: 2nd editionDescription: xviii, 413 pages : illustrations ; 24 cmISBN: - 9781783265282 (hardcover : alk. paper)
- 570.2825 ERN-R 23
- QH212.T7 E76 2015
| Item type | Current library | Collection | Shelving location | Call number | Status | Date due | Barcode | Item holds |
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BITS Pilani Hyderabad | 570 | General Stack (For lending) | 570.2825 ERN-R (Browse shelf(Opens below)) | Available | 27372 |
Includes bibliographical references and index.
High-resolution transmission electron microscopy -- Scanning transmission electron microscopy -- Limits of conventional atomic-resolution electron microscopy -- Basic principles of electron optics -- Gaussian dioptrics -- Aberrations -- Aberration correctors -- Aberration-corrected imaging.
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