Aberration-corrected imaging in transmission electron microscopy : an introduction / Rolf Erni, Swiss Federal Laboratories for Materials Science and Technology (Empa), Switzerland.
Material type:
TextPublication details: London Imperial College Press 2015Edition: 2nd editionDescription: xviii, 413 pages : illustrations ; 24 cmISBN: - 9781783265282 (hardcover : alk. paper)
- 570.2825 ERN-RÂ 23
- QH212.T7Â E76 2015
| Item type | Current library | Collection | Shelving location | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|---|
Books
|
BITS Pilani Hyderabad | 570 | General Stack (For lending) | 570.2825 ERN-R (Browse shelf(Opens below)) | Available | 27372 |
Browsing BITS Pilani Hyderabad shelves, Shelving location: General Stack (For lending), Collection: 570 Close shelf browser (Hides shelf browser)
|
|
|
|
|
|
|
||
| 570.258 ALO-U Introduction to systems biology : design principles of biological circuits / | 570.28 IGN-S Basic bioinformatics / | 570.2825 DUF-Y Life at the nanoscale : atomic force microscopy of live cells / | 570.2825 ERN-R Aberration-corrected imaging in transmission electron microscopy : | 570.2825 SCH-H Scanning electron microscopy for the life sciences / | 570.2825 ZEW-A 4D electron microscopy : imaging in space and time / | 570.285 AKA-A Computational genomics with R / |
Includes bibliographical references and index.
High-resolution transmission electron microscopy -- Scanning transmission electron microscopy -- Limits of conventional atomic-resolution electron microscopy -- Basic principles of electron optics -- Gaussian dioptrics -- Aberrations -- Aberration correctors -- Aberration-corrected imaging.
There are no comments on this title.